Charge Injection in Normally-Off p-GaN Gate AlGaN/GaN-on-Si HFETs. - Luca Sayadi; Giuseppe Iannaccone; Sebastien Sicre; Simone Lavanga; Gianluca Fiori; Oliver Haeberlen; Gilberto Curatola (ESSDERC, 2018)

Dynamic Effects in p-GaN Gate GaN-on-Si Heterojunction Field Effect Transistors. - Luca Sayadi (2020)

Charge Trapping in GaN Power Transistors: Challenges and Perspectives. - Matteo Meneghini; Nicola Modolo; Arianna Nardo; Carlo De Santi; Andrea Minetto; Luca Sayadi; Christian Koller; Sebastien Sicre; Gerhard Prechtl; Gaudenzio Meneghesso; Enrico Zanoni (BCICTS, 2021)

A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level. - Nicola Modolo; Andrea Minetto; Carlo De Santi; Luca Sayadi; Sebastien Sicre; Gerhard Prechtl; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (IRPS, 2021)

Modeling Hot-Electron Trapping in GaN-based HEMTs. - Nicola Modolo; Carlo De Santi; Andrea Minetto; Luca Sayadi; Sebastien Sicre; Gerhard Prechtl; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (IRPS, 2022)