A microscopic physical description of RTN current fluctuations in HfOx RRAM. - Francesco Maria Puglisi; Paolo Pavan; Luca Vandelli; Andrea Padovani; Matteo Bertocchi; Luca Larcher (IRPS, 2015)

Substrate and temperature influence on the trap density distribution in high-k III-V MOSFETs. - G. Sereni; Luca Vandelli; Roberto Cavicchioli; Luca Larcher; Dmitry Veksler; Gennadi Bersuker (IRPS, 2015)

Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials. - Luca Larcher; Francesco Maria Puglisi; Andrea Padovani; Luca Vandelli; Paolo Pavan (PATMOS, 2016)

Impact of Al-based Dipole Formation on Gate Stack Integrity and Reliability. - Bruno Coppolelli; Davide Cornigli; Zheyuan Chen; Andrea Padovani; Sara Vecchi; Yanliu Dang; Luc Thomas; Luca Vandelli; Jianxin Lei; Naomi Yoshida; Renu Whig; Federico Nardi; et al. (IRPS, 2025)