Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. - Lucas B. Zilch; Állan G. Ferreira; Marcelo Soares Lubaszewski; Tiago R. Balen (LATS, 2022)

Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. - Állan G. Ferreira; Lucas B. Zilch; Vinícius Navarro; Marcelo Soares Lubaszewski; Tiago R. Balen (SBCCI, 2023)

Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning. - Állan G. Ferreira; Lucas B. Zilch; Marcelo Soares Lubaszewski; Tiago R. Balen (IEEE Des. Test, 2025)