Yield Analysis by Error Propagation Using Numerical Derivatives Considering WD and D2D variations. - Lucas Brusamarello; Roberto da Silva; Ricardo A. L. Reis; Gilson I. Wirth (ISVLSI, 2007)

Obtaining delay distribution of dynamic logic circuits by error propagation at the electrical level. - Lucas Brusamarello; Roberto da Silva; Gilson I. Wirth; Ricardo A. L. Reis (VLSI-SoC, 2007)

Statistical and Numerical Approach for a Computer efficient circuit yield analysis. - Lucas Brusamarello; Roberto da Silva; Gilson I. Wirth; Ricardo Reis 001 (VLSI-SoC (Selected Papers), 2007)

Técnicas probabilísticas para análise de yield em nível elétrico usando propagação de erros e derivadas numéricas. - Lucas Brusamarello; Roberto da Silva; Gilson I. Wirth; Ricardo Augusto da Luz Reis (RITA, 2007)

Probabilistic Approach for Yield Analysis of Dynamic Logic Circuits. - Lucas Brusamarello; Roberto da Silva; Gilson I. Wirth; Ricardo A. L. Reis (IEEE Trans. Circuits Syst. I Regul. Pap., 2008)

NBTI-aware technique for transistor sizing of high-performance CMOS gates. - Maurício Banaszeski da Silva; Vinicius V. A. Camargo; Lucas Brusamarello; Gilson I. Wirth; Roberto da Silva (LATW, 2009)

Statistical RTS model for digital circuits. - Lucas Brusamarello; Gilson I. Wirth; Roberto da Silva (Microelectron. Reliab., 2009)

Statistical characterization of standard cells using design of experiments with response surface modeling. - Miguel Miranda; Philippe Roussel; Lucas Brusamarello; Gilson I. Wirth (DAC, 2011)

Fast and accurate statistical characterization of standard cell libraries. - Lucas Brusamarello; Gilson I. Wirth; Philippe Roussel; Miguel Miranda (Microelectron. Reliab., 2011)

Modeling and simulation of device variability and reliability at the electrical level. - Lucas Brusamarello (2011)

Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants. - Gilson I. Wirth; Dragica Vasileska; N. Ashraf; Lucas Brusamarello; R. Della Giustina; P. Srinivasan 002 (Microelectron. Reliab., 2012)