Self-Heating in 28 FDSOI UTBB MOSFETs at Cryogenic Temperatures. - Lucas Nyssens; Arka Halder; Babak Kazemi Esfeh; Nicolas Planes; Michel Haond; Denis Flandre; Jean-Pierre Raskin; Valeriya Kilchytska (ESSDERC, 2019)

Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI. - Martin Rack; Lucas Nyssens; Quentin Courte; Dimitri Lederer; Jean-Pierre Raskin (ESSDERC, 2021)

Analysis of Back-Gate Bias Control on EVM Measurements of a Dual-Band Power Amplifier in 22 nm FD-SOI for 5G 28 and 39 GHz Applications. - Lucas Nyssens; M. Nabet; Martin Rack; Youssef Bendou; Sidina Wane; Jacques Sombrin; Jean-Pierre Raskin; Dimitri Lederer (IEEE Trans. Circuits Syst. I Regul. Pap., 2025)