Fast thermal fatigue on top metal layer of power devices. - Sebastiano Russo; Romeo Letor; Orazio Viscuso; Lucia Torrisi; Gianluigi Vitali (Microelectron. Reliab., 2002)

High temperature long term stability of SiC Schottky diodes. - Antonio Testa; Salvatore De Caro; Sebastiano Russo; D. Patti; Lucia Torrisi (Microelectron. Reliab., 2011)