A tester architecture suitable for MEMS calibration and testing. - Lyl M. Ciganda Brasca; Paolo Bernardi; Matteo Sonza Reorda; Dimitri Barbieri; Maurizio Straiotto; Luciano Bonaria (ITC, 2010)

A Parallel Tester Architecture for Accelerometer and Gyroscope MEMS Calibration and Test. - Lyl M. Ciganda Brasca; Paolo Bernardi; Matteo Sonza Reorda; Dimitri Barbieri; Luciano Bonaria; Roberto Losco; Luciano Marcigot; Maurizio Straiotto (J. Electron. Test., 2011)

A Dynamic Greedy Test Scheduler for Optimizing Probe Motion in In-Circuit Testers. - Luciano Bonaria; Maurizio Raganato; Matteo Sonza Reorda; Giovanni Squillero (ETS, 2019)

Test-Plan Optimization for Flying-Probes In-Circuit Testers. - Luciano Bonaria; Maurizio Raganato; Giovanni Squillero; Matteo Sonza Reorda (ITC-Asia, 2019)