Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach. - Ludovic Boyer; Olivier Fruchier; Petru Notingher Jr.; Serge Agnel; Alain Toureille; Bernard Rousset; Jean-Louis Sanchez (IAS, 2008)

Measurement of Charge Evolution in Oxides of DC Stressed MOS Structures. - Ludovic Boyer; Petru Notingher Jr.; Serge Agnel; Bernard Rousset; Jean-Louis Sanchez (IAS, 2010)

Design of a 4-phase intercell transformer converter for a space charge measuring system. - Thierry Martiré; Jean-Charles Laurentie; Mourad Jebli; Ludovic Boyer; Mickael Petit (ICIT, 2018)