Insight Into HCI Reliability on I/O Nitrided Devices. - C. Doyen; V. Yon; Xavier Garros; Luigi Basset; Tadeu Mota Frutuoso; C. Dagon; Cheikh Diouf; X. Federspiel; V. Millon; Frederic Monsieur; C. Pribat; David Roy 001 (IRPS, 2023)

Catch the Pitch of 5G FWA: EMF and Throughput Measurements of 3.5-GHz Standalone Deployment in a Baseball Stadium. - Luca Chiaraviglio; Chiara Lodovisi; Daniele Franci; Settimio Pavoncello; Stefano Coltellacci; Marco Donald Migliore; Timothy Cicciarelli; Luigi Basset; Leonardo Spugnini; Tommaso Aureli; Mohamed-Slim Alouini (IEEE Open J. Commun. Soc., 2023)

Influence of Process Integration on pBTI Degradation in Analog SOI nMOSFETs. - Abygaël Viey; William Vandendaele; P. Kouaté Wafo; Xavier Garros; Luigi Basset; F. Ponthenier; Joris Lacord; R. Fillon; X. Federspiel; D. Roy; S. Joblot; Dominique Golanski (IRPS, 2025)

Measuring 5G Exposure From Multiple Terminals and Base Station in Standalone FWA Networks. - Luca Chiaraviglio; Margherita Montenero; Chiara Lodovisi; Stefano Salsano; Andrea Mayer; Paolo Lungaroni; Nicola Blefari-Melazzi; Luigi Basset; Marco Lo Duca; Timothy Cicciarelli; Luca Lorenzi; Damiano Trucchi; et al. (IEEE Access, 2025)