Statistical Prediction Based on Censored Life Data. - Luis A. Escobar; William Q. Meeker (Technometrics, 1999)

Discussion. - William Q. Meeker; Luis A. Escobar (Technometrics, 2004)

Sample Size and Number of Failure Requirements for Demonstration Tests With Log-Location-Scale Distributions and Failure Censoring. - Scott W. McKane; Luis A. Escobar; William Q. Meeker (Technometrics, 2005)

Avoiding Problems With Normal Approximation Confidence Intervals for Probabilities. - Yili Hong 001; William Q. Meeker; Luis A. Escobar (Technometrics, 2008)

The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles. - Yili Hong 001; William Q. Meeker; Luis A. Escobar (IEEE Trans. Reliab., 2008)

Using Accelerated Life Tests Results to Predict Product Field Reliability. - William Q. Meeker; Luis A. Escobar; Yili Hong 001 (Technometrics, 2009)

Accelerated Destructive Degradation Test Planning. - Ying Shi; Luis A. Escobar; William Q. Meeker (Technometrics, 2009)

Peak demand forecasting for a seasonal product using Bayesian approach. - M. A. Rahman; Bhaba R. Sarker; Luis A. Escobar (J. Oper. Res. Soc., 2011)

Methods for Planning Repeated Measures Degradation Studies. - Brian P. Weaver; William Q. Meeker; Luis A. Escobar; Joanne Wendelberger (Technometrics, 2013)

Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes. - Wei Zhang; Ye Tian; Luis A. Escobar; William Q. Meeker (Technometrics, 2017)

Effects of Antimodularity and Multiscale Influence in Random Boolean Networks. - Luis A. Escobar; Hyobin Kim; Carlos Gershenson (Complex., 2019)