Reliability Analysis for Laptop Computer Under Electrical Harmonics. - Luis Carlos Méndez-González; Manuel Iván Rodríguez-Borbón; Manuel R. Piña-Monarrez; Roberto Ambrosio; Arturo Del Valle (Qual. Reliab. Eng. Int., 2016)

Reliability Model for Electronic Devices under Time Varying Voltage. - Luis Carlos Méndez-González; Manuel Iván Rodríguez-Borbón; Delia J. Valles-Rosales; Arturo Del Valle; Arnoldo Rodriguez (Qual. Reliab. Eng. Int., 2016)

Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution. - Luis Alberto Rodríguez-Picón; Luis Carlos Méndez-González; Manuel Iván Rodríguez-Borbón; Arturo Del Valle (Qual. Reliab. Eng. Int., 2016)

Reliability analysis for electronic devices using beta-Weibull distribution. - Luis Carlos Méndez-González; Luis Alberto Rodríguez-Picón; Delia J. Valles-Rosales; Roberto Romero-López; Abel Eduardo Quezada-Carreón (Qual. Reliab. Eng. Int., 2017)

Degradation modeling based on gamma process models with random effects. - Luis Alberto Rodríguez-Picón; Anna Patricia Rodríguez-Picón; Luis Carlos Méndez-González; Manuel Iván Rodríguez-Borbón; Alejandro Alvarado-Iniesta (Commun. Stat. Simul. Comput., 2018)

Using regression models for predicting the product quality in a tubing extrusion process. - Vicente García 001; J. Salvador Sánchez 001; Luis Alberto Rodríguez-Picón; Luis Carlos Méndez-González; Humberto de Jesús Ochoa Domínguez (J. Intell. Manuf., 2019)

Reliability analysis using exponentiated Weibull distribution and inverse power law. - Luis Carlos Méndez-González; Luis Alberto Rodríguez-Picón; Delia J. Valles-Rosales; Alejandro Alvarado-Iniesta; Abel Eduardo Quezada-Carreón (Qual. Reliab. Eng. Int., 2019)

Revisiting the Dissimilarity Representation in the Context of Regression. - Vicente García 001; J. Salvador Sánchez 001; Rafael Martínez-Peláez; Luis Carlos Méndez-González (IEEE Access, 2021)

A Study of Stopping Rules in the Steepest Ascent Methodology for the Optimization of a Simulated Process. - Paulo Eduardo García-Nava; Luis Alberto Rodríguez-Picón; Luis Carlos Méndez-González; Iván Juan Carlos Pérez-Olguín (Axioms, 2022)

A Gamma Process with Three Sources of Variability. - Luis Alberto Rodríguez-Picón; Luis Carlos Méndez-González; Iván Juan Carlos Pérez-Olguín; Jesús Israel Hernández Hernández (Symmetry, 2023)

An Additive Chen Distribution with Applications to Lifetime Data. - Luis Carlos Méndez-González; Luis Alberto Rodríguez-Picón; Iván Juan Carlos Pérez-Olguín; Luis Ricardo Vidal Portilla (Axioms, 2023)

Emotional Classification Method (ECW): A Methodology for Measuring Emotional Sustainability in a Work Environment Utilizing Artificial Intelligence. - Florencio Abraham Roldán-Castellanos; Iván Juan Carlos Pérez-Olguín; Aimeé Gutiérrez-Vázquez; Luis Carlos Méndez-González; Luis Alberto Rodríguez-Picón (Axioms, 2023)

A reliability analysis for electronic devices under an extension of exponentiated perks distribution. - Luis Carlos Méndez-González; Luis Alberto Rodríguez-Picón; Iván Juan Carlos Pérez-Olguín; Vicente García 001; Abel Eduardo Quezada-Carreón (Qual. Reliab. Eng. Int., 2023)

Characterization and Dataset Compilation of Torque-Angle Curve Behavior for M2/M3 Screws. - Iván Juan Carlos Pérez-Olguín; Consuelo Catalina Fernández-Gaxiola; Luis Alberto Rodríguez-Picón; Luis Carlos Méndez-González (Data, 2024)