Laser diode COFD analysis by thermoreflectance microscopy. - Stefan Dilhaire; Stéphane Grauby; Sébastien Jorez; Luis David Patiño Lopez; Emmanuel Schaub; Wilfrid Claeys (Microelectron. Reliab., 2001)

Determination of passive SiO2-Au microstructure resonant frequencies. - Guillaume Marinier; Stefan Dilhaire; Luis David Patiño Lopez; Mohamed Benzohra (Microelectron. Reliab., 2003)

Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. - Luis David Patiño Lopez; Stéphane Grauby; Stefan Dilhaire; M. Amine Salhi; Wilfrid Claeys; Stéphane Lefèvre; Sebastian Volz (Microelectron. J., 2004)

Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. - Stéphane Grauby; M. Amine Salhi; Luis David Patiño Lopez; Wilfrid Claeys; Benoît Charlot; Stefan Dilhaire (Microelectron. Reliab., 2008)

Joule expansion imaging techniques on microlectronic devices. - Stéphane Grauby; Luis David Patiño Lopez; M. Amine Salhi; Etienne Puyoo; Jean-Michel Rampnoux; Wilfrid Claeys; Stefan Dilhaire (Microelectron. J., 2009)