Power Supply Noise in Delay Testing. - Jing Wang 006; D. M. H. Walker; Ananta K. Majhi; Bram Kruseman; Guido Gronthoud; Luis Elvira Villagra; Paul van de Wiel; Stefan Eichenberger (ITC, 2006)

Modeling Power Supply Noise in Delay Testing. - Jing Wang 006; Duncan M. Hank Walker; Xiang Lu; Ananta K. Majhi; Bram Kruseman; Guido Gronthoud; Luis Elvira Villagra; Paul J. A. M. van de Wiel; Stefan Eichenberger (IEEE Des. Test Comput., 2007)

A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits. - Josep Rius 001; Luis Elvira Villagra; Maurice Meijer (ETS, 2009)