Autoassociative Neural Networks for Fault Diagnosis in Semiconductor Manufacturing. - Luis J. Barrios; Lissette Lemus del Cueto (IEA/AIE (Vol. 2), 1998)

Search of hidden properties in sensor data using recurrent neural networks. - Lissette Lemus del Cueto; Nancy Lopez; Luis J. Barrios; Roberto Cruz (Data Mining and Knowledge Discovery: Theory, Tools, and Technology, 1999)

Knowledge acquisition from batch semiconductor manufacturing data. - María Dolores del Castillo Sobrino; Luis J. Barrios (Intell. Data Anal., 1999)

Knowledge discovery process for scientific and engineering data. - Luis J. Barrios; Stephan Rudolph (Data Mining and Knowledge Discovery: Theory, Tools, and Technology, 2002)

An EEG-Based Design for the Online Detection of Movement Intention. - Jaime Ibáñez; Jose Ignacio Serrano; M. Dolores del Castillo; Luis J. Barrios; Juan Alvaro Gallego; Eduardo Rocon de Lima (IWANN (1), 2011)