Impact of stress on various circuit characteristics in 65nm PDSOI technology. - Sushant Suryagandh; Mayank Gupta; Zhiyuan Wu; Srinath Krishnan; Mario Pelella; Jung-Suk Goo; Ciby Thuruthiyil; Judy X. An; Brian Q. Chen; Niraj Subba; Luis Zamudio; James Yonemura; et al. (ESSCIRC, 2007)

SRAM read current variability and its dependence on transistor statistics. - Sriramkumar Venugopalan; Vivek Joshi; Luis Zamudio; Matthias Goldbach; Gert Burbach; Ralf Van Bentum; Sriram Balasubramanian (CICC, 2013)

Deep Learning-Based Segmentation and Uncertainty Assessment for Automated Analysis of Myocardial Perfusion MRI Datasets Using Patch-Level Training and Advanced Data Augmentation. - Dilek Mirgun Yalcinkaya; Khalid Youssef; Bobby Heydari; Luis Zamudio; Rohan Dharmakumar; Behzad Sharif (EMBC, 2021)