A characterization of the Rodinia benchmark suite with comparison to contemporary CMP workloads. - Shuai Che; Jeremy W. Sheaffer; Michael Boyer; Lukasz G. Szafaryn; Liang Wang 055; Kevin Skadron (IISWC, 2010)

Trellis: Portability across architectures with a high-level framework. - Lukasz G. Szafaryn; Todd Gamblin; Bronis R. de Supinski; Kevin Skadron (J. Parallel Distributed Comput., 2013)

Evaluating Overheads of Multibit Soft-Error Protection in the Processor Core. - Lukasz G. Szafaryn; Brett H. Meyer; Kevin Skadron (IEEE Micro, 2013)

The resilience wall: Cross-layer solution strategies. - Subhasish Mitra; Pradip Bose; Eric Cheng; Chen-Yong Cher; Hyungmin Cho; Rajiv V. Joshi; Young Moon Kim; Charles R. Lefurgy; Yanjing Li; Kenneth P. Rodbell; Kevin Skadron; James H. Stathis; et al. (VLSI-DAT, 2014)

Clear: cross-layer exploration for architecting resilience combining hardware and software techniques to tolerate soft errors in processor cores. - Eric Cheng; Shahrzad Mirkhani; Lukasz G. Szafaryn; Chen-Yong Cher; Hyungmin Cho; Kevin Skadron; Mircea R. Stan; Klas Lilja; Jacob A. Abraham; Pradip Bose; Subhasish Mitra (DAC, 2016)

Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. - Eric Cheng; Jacob A. Abraham; Pradip Bose; Alper Buyuktosunoglu; Keith A. Campbell; Deming Chen; Chen-Yong Cher; Hyungmin Cho; Binh Q. Le; Klas Lilja; Shahrzad Mirkhani; Kevin Skadron; et al. (ICCD, 2017)

Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). - Eric Cheng; Shahrzad Mirkhani; Lukasz G. Szafaryn; Chen-Yong Cher; Hyungmin Cho; Kevin Skadron; Mircea R. Stan; Klas Lilja; Jacob A. Abraham; Pradip Bose; Subhasish Mitra (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

Killi: Runtime Fault Classification to Deploy Low Voltage Caches without MBIST. - Shrikanth Ganapathy; John Kalamatianos; Bradford M. Beckmann; Steven Raasch; Lukasz G. Szafaryn (HPCA, 2019)

CLEAR Cross-Layer Resilience: A Retrospective. - Eric Cheng; Hyungmin Cho; Shahrzad Mirkhani; Lukasz G. Szafaryn; Jacob A. Abraham; Pradip Bose; Chen-Yong Cher; Klas Lilja; Kevin Skadron; Mircea Stan; Subhasish Mitra (IEEE Des. Test, 2025)