The advantages of boundary-scan testing. - Stephen L. Dingle; Luke D. Lacroix; Peter A. Twombly (VTS, 1991)

The evolution of build-up package technology and its design challenges. - Edmund D. Blackshear; Moises Cases; Erich Klink; Stephen R. Engle; Ronald S. Malfatt; Daniel N. deAraujo; Stefano Oggioni; Luke D. Lacroix; Jamil A. Wakil; Nam H. Pham; Gareth G. Hougham; David J. Russell (IBM J. Res. Dev., 2005)