Surface Layer Analysis of Si Sphere by XRF and XPS. - Lulu Zhang 002; Yasushi Azuma; Akira Kurokawa; Naoki Kuramoto; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2015)

Realization of the Kilogram Based on the Planck Constant at NMIJ. - Naoki Kuramoto; Lulu Zhang 002; Shigeki Mizushima; Kazuaki Fujita; Yasushi Azuma; Akira Kurokawa; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2017)

Mass Measurement of 28Si-Enriched Spheres at NMIJ for the Determination of the Avogadro Constant. - Shigeki Mizushima; Naoki Kuramoto; Lulu Zhang 002; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2017)

Thickness Measurement of Oxide and Carbonaceous Layers on a 28Si Sphere by XPS. - Lulu Zhang 002; Naoki Kuramoto; Yasushi Azuma; Akira Kurokawa; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2017)

Volume Measurement of a 28Si-Enriched Sphere for a Determination of the Avogadro Constant at NMIJ. - Naoki Kuramoto; Lulu Zhang 002; Kazuaki Fujita; Sho Okubo; Hajime Inaba; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2019)

Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ. - Naoki Kuramoto; Shigeki Mizushima; Lulu Zhang 002; Kazuaki Fujita; Sho Okubo; Hajime Inaba; Yasushi Azuma; Akira Kurokawa; Yuichi Ota; Kenichi Fujii (IEEE Trans. Instrum. Meas., 2021)

XPS Analysis of a 28Si-Enriched Sphere for Realization of the Kilogram. - Lulu Zhang 002; Naoki Kuramoto; Akira Kurokawa (IEEE Trans. Instrum. Meas., 2021)

Investigating Stability of Si Sphere Surface Layer in Ambient-Vacuum Cyclic Measurements Using Ellipsometry. - Kazuaki Fujita; Kenichi Fujii; Lulu Zhang 002; Yasushi Azuma; Shigeki Mizushima; Naoki Kuramoto (IEEE Trans. Instrum. Meas., 2022)