Reduction of Power Dissipation during Scan Testing by Test Vector Ordering. - Wang-Dauh Tseng; Lung-Jen Lee (MTV, 2007)

Power Reduction during Scan Testing Based on Multiple Capture Technique. - Lung-Jen Lee; Wang-Dauh Tseng; Rung-Bin Lin (IEICE Trans. Electron., 2008)

A Multi-dimensional Pattern Run-Length Method for Test Data Compression. - Lung-Jen Lee; Wang-Dauh Tseng; Rung-Bin Lin; Chen-Lun Lee (Asian Test Symposium, 2009)

Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing. - Lung-Jen Lee; Wang-Dauh Tseng; Rung-Bin Lin; Chi-Wei Yu (Asian Test Symposium, 2009)

Test Data Compression Using Multi-dimensional Pattern Run-length Codes. - Wang-Dauh Tseng; Lung-Jen Lee (J. Electron. Test., 2010)

Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction. - Wang-Dauh Tseng; Lung-Jen Lee; Rung-Bin Lin (IET Comput. Digit. Tech., 2010)

Deterministic ATPG for Low Capture Power Testing. - Lung-Jen Lee; Chia-Cheng He; Wang-Dauh Tseng (MTV, 2012)

Two-Way Multicasting for Test Data Compression. - Lung-Jen Lee; Wang-Dauh Tseng; Wei-Shun Chen (MTV, 2012)

Dual-LFSR Reseeding for Low Power Testing. - Lung-Jen Lee; Wang-Dauh Tseng; Wen-Ting Yang (MTV, 2012)

$2^{n}$ Pattern Run-Length for Test Data Compression. - Lung-Jen Lee; Wang-Dauh Tseng; Rung-Bin Lin; Cheng-Ho Chang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction. - Lung-Jen Lee (J. Electron. Test., 2013)

A Low-Complexity Color Image Compression Algorithm Based on AMBTC. - Hsiao-Hsuan Cheng; Chiung-An Chen; Lung-Jen Lee; Ting-Lan Lin; Yih-Shyh Chiou; Shih-Lun Chen (ICCE-TW, 2019)