A 3-port Register File Design for Improved Fault Tolerance on Resistive Defects in Core-Cells. - Lushan Liu; Ramalingam Sridhar; Shambhu J. Upadhyaya (DFT, 2006)

Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. - Lushan Liu; Pradeep Nagaraj; Shambhu J. Upadhyaya; Ramalingam Sridhar (J. Electron. Test., 2008)