On High-Quality, Low Energy BIST Preparation at RT-Level. - Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001; Salvador Manich; Luz Balado; Joan Figueras (LATW, 2002)

On the selection of efficient arithmetic additive test pattern generators [logic test]. - Salvador Manich; L. García; Luz Balado; Emili Lupon; Josep Rius 001; Rosa Rodríguez-Montañés; Joan Figueras (ETW, 2003)

Test Engineering Education in Europe: the EuNICE-Test Project. - Yves Bertrand; Marie-Lise Flottes; Luz Balado; Joan Figueras; Anton Biasizzo; Franc Novak; Stefano Di Carlo; Paolo Prinetto; Nicoleta Pricopi; Hans-Joachim Wunderlich; Jean-Pierre Van der Heyden (MSE, 2003)

Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ. - Marie-Lise Flottes; Yves Bertrand; Luz Balado; Emili Lupon; Anton Biasizzo; Franc Novak; Stefano Di Carlo; Paolo Prinetto; Nicoleta Pricopi; Hans-Joachim Wunderlich (DELTA, 2004)

BIST Technique by Equally Spaced Test Vector Sequences. - Salvador Manich; L. García; Luz Balado; Emili Lupon; Josep Rius 001; Rosa Rodríguez-Montañés; Joan Figueras (VTS, 2004)

Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. - Rosa Rodríguez-Montañés; D. Muñoz; Luz Balado; Joan Figueras (J. Electron. Test., 2004)

On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. - Marcelino B. Santos; Isabel C. Teixeira; João Paulo Teixeira 001; Salvador Manich; Luz Balado; Joan Figueras (J. Electron. Test., 2004)

Testing Biquad Filters under Parametric Shifts Using X-Y Zoning. - R. Sanahuja; Victor Barcons; Luz Balado; Joan Figueras (J. Electron. Test., 2005)

Lissajous Based Mixed-Signal Testing for N-Observable Signals. - Luz Balado; Emili Lupon; L. García; Rosa Rodríguez-Montañés; Joan Figueras (DDECS, 2006)

Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures. - Luz Balado; Emili Lupon; Joan Figueras; Miquel Roca 001; Eugeni Isern 001; Rodrigo Picos (IEEE Trans. Circuits Syst. I Regul. Pap., 2009)

Analog circuit test based on a digital signature. - Alvaro Gómez; Ricard Sanahuja; Luz Balado; Joan Figueras (DATE, 2010)

M-S test based on specification validation using octrees in the measure space. - Álvaro Gómez-Pau; Luz Balado; Joan Figueras (ETS, 2013)

M-S specification binning based on digitally coded indirect measurements. - Álvaro Gómez-Pau; Luz Balado; Joan Figueras (ETS, 2014)

Analog circuits testing using digitally coded indirect measurements. - Álvaro Gómez-Pau; Luz Balado; Joan Figueras (DTIS, 2015)

Indirect test of M-S circuits using multiple specification band guarding. - Álvaro Gómez-Pau; Luz Balado; Joan Figueras (Integr., 2016)

Efficient Production Binning Using Octree Tessellation in the Alternate Measurements Space. - Álvaro Gómez-Pau; Luz Balado; Joan Figueras (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Multi-Directional Space Tessellation to Improve the Decision Boundary in Indirect Mixed-Signal Testing. - Álvaro Gómez-Pau; Luz Balado; Joan Figueras (J. Electron. Test., 2017)

Indirect and adaptive test of analogue circuits based on preselected steady-state response measures. - Álvaro Gómez-Pau; Emili Lupon; Luz Balado; Joan Figueras (IET Circuits Devices Syst., 2020)