Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. - Jingchen Cao; Lyuan Xu; Bharat L. Bhuva; Shi-Jie Wen; Richard Wong; Balaji Narasimham; Lloyd W. Massengill (IRPS, 2019)

Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. - Lyuan Xu; Jingchen Cao; Bharat L. Bhuva; Indranil Chatterjee; Shi-Jie Wen; Richard Wong; Lloyd W. Massengill (IRPS, 2019)

Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. - Jingchen Cao; Lyuan Xu; Shi-Jie Wen; Rita Fung; Balaji Narasimham; Lloyd W. Massengill; Bharat L. Bhuva (IRPS, 2020)

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. - Lyuan Xu; Jingchen Cao; John Brockman; Carlo Cazzaniga; Christopher Frost 002; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2020)

High-Current State triggered by Operating-Frequency Change. - Lyuan Xu; Jingchen Cao; Shi-Jie Wen; Rita Fung; Jamie Markevitch; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2020)

Automatic preprocessing pipeline for white matter functional analyses of large-scale databases. - Yurui Gao; Dylan R. Lawless; Muwei Li; Yu Zhao; Kurt G. Schilling; Lyuan Xu; Andrea T. Shafer; Lori L. Beason-Held; Susan M. Resnick; Baxter P. Rogers; Zhaohua Ding; Adam W. Anderson; et al. (Image Processing, 2023)

Functional alterations in bipartite network of white and grey matters during aging. - Yurui Gao; Yu Zhao; Muwei Li; Richard D. Lawless; Kurt G. Schilling; Lyuan Xu; Andrea T. Shafer; Lori L. Beason-Held; Susan M. Resnick; Baxter P. Rogers; Zhaohua Ding; Adam W. Anderson; et al. (NeuroImage, 2023)

White matter engagement in brain networks assessed by integration of functional and structural connectivity. - Muwei Li; Kurt G. Schilling; Lyuan Xu; Soyoung Choi; Yurui Gao; Zhongliang Zu; Adam W. Anderson; Zhaohua Ding; John C. Gore (NeuroImage, 2024)