On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs. - M. A. Exarchos; François Dieudonné; Jalal Jomaah; George J. Papaioannou; Francis Balestra (Microelectron. Reliab., 2004)

Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. - Dimitrios N. Kouvatsos; Vojkan Davidovic; George J. Papaioannou; Ninoslav Stojadinovic; Loukas Michalas; M. A. Exarchos; Apostolos T. Voutsas; Dimitrios Goustouridis (Microelectron. Reliab., 2004)

The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs. - M. A. Exarchos; George J. Papaioannou; Jalal Jomaah; Francis Balestra (Microelectron. Reliab., 2005)

Investigation of charging mechanisms in metal-insulator-metal structures. - M. A. Exarchos; V. Theonas; Patrick Pons; George J. Papaioannou; S. Mellé; David Dubuc; Fabio Coccetti; Robert Plana (Microelectron. Reliab., 2005)

Charging of radiation induced defects in RF MEMS dielectric films. - M. A. Exarchos; E. Papandreou; Patrick Pons; Mohamed Lamhamdi; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2006)

An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors. - Loukas Michalas; M. A. Exarchos; George J. Papaioannou; Dimitrios N. Kouvatsos; Apostolos T. Voutsas (Microelectron. Reliab., 2007)

Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques. - Despina C. Moschou; M. A. Exarchos; Dimitrios N. Kouvatsos; George J. Papaioannou; Apostolos T. Voutsas (Microelectron. Reliab., 2007)

Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. - Despina C. Moschou; M. A. Exarchos; Dimitrios N. Kouvatsos; George J. Papaioannou; Aggeliki Arapoyanni; Apostolos T. Voutsas (Microelectron. Reliab., 2008)

Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs. - M. A. Exarchos; George J. Papaioannou; Jalal Jomaah; Francis Balestra (Microelectron. Reliab., 2009)