Integrated modeling of Self-heating of confined geometry (FinFET, NWFET, and NSHFET) transistors and its implications for the reliability of sub-20 nm modern integrated circuits. - Woojin Ahn; Sang Hoon Shin; Chunsheng Jiang; Hai Jiang; M. A. Wahab; Muhammad Ashraful Alam (Microelectron. Reliab., 2018)