A Fuzzy Approach to Map Building. - H. Zreak; M. Alwan; M. Khaddour (IEA/AIE, 1999)

Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET. - M. Alwan; B. Beydoun; K. Ketata; M. Zoaeter (Microelectron. J., 2007)

Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses. - M. Alwan; B. Beydoun; K. Ketata; M. Zoaeter (Microelectron. Reliab., 2007)