Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. - Stefan Dilhaire; M. Amine Salhi; Stéphane Grauby; Wilfrid Claeys (Microelectron. Reliab., 2003)

Sensing temperature in CMOS circuits for Thermal Testing. - Josep Altet; Antonio Rubio 001; M. Amine Salhi; Jose Luis Gálvez; Stefan Dilhaire; Ashish Syal; André Ivanov (VTS, 2004)

Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. - Luis David Patiño Lopez; Stéphane Grauby; Stefan Dilhaire; M. Amine Salhi; Wilfrid Claeys; Stéphane Lefèvre; Sebastian Volz (Microelectron. J., 2004)

ElectroStatic Discharge Fault Localization by Laser Probing. - Stéphane Grauby; M. Amine Salhi; Wilfrid Claeys; D. Trias; Stefan Dilhaire (Microelectron. Reliab., 2005)

Time gating imaging through thick silicon substrate: a new step towards backside characterisation. - Jean-Michel Rampnoux; H. Michel; M. Amine Salhi; Stéphane Grauby; Wilfrid Claeys; Stefan Dilhaire (Microelectron. Reliab., 2006)

Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. - Eduardo Aldrete-Vidrio; M. Amine Salhi; Josep Altet; Stéphane Grauby; Diego Mateo; H. Michel; L. Clerjaud; Jean-Michel Rampnoux; Antonio Rubio 001; Wilfrid Claeys; Stefan Dilhaire (ETS, 2008)

Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. - Stéphane Grauby; M. Amine Salhi; Luis David Patiño Lopez; Wilfrid Claeys; Benoît Charlot; Stefan Dilhaire (Microelectron. Reliab., 2008)

Joule expansion imaging techniques on microlectronic devices. - Stéphane Grauby; Luis David Patiño Lopez; M. Amine Salhi; Etienne Puyoo; Jean-Michel Rampnoux; Wilfrid Claeys; Stefan Dilhaire (Microelectron. J., 2009)