High reliability level demonstrated on 980nm laser diode. - J. Van de Casteele; Dominique Laffitte; G. Gelly; C. Starck; M. Bettiati (Microelectron. Reliab., 2003)

Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes. - Pamela Del Vecchio; Arnaud Curutchet; Yannick Deshayes; M. Bettiati; F. Laruelle; Nathalie Labat; Laurent Béchou (Microelectron. Reliab., 2015)