Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions. - M. Blaho; Dionyz Pogany; L. Zullino; A. Andreini; Erich Gornik (Microelectron. Reliab., 2002)

Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. - M. Blaho; Dionyz Pogany; Erich Gornik; Marie Denison; Gerhard Groos; Matthias Stecher (Microelectron. Reliab., 2003)

A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. - Viktor Dubec; Sergey Bychikhin; M. Blaho; Dionyz Pogany; Erich Gornik; J. Willemen; Ning Qu; Wolfgang Wilkening; L. Zullino; A. Andreini (Microelectron. Reliab., 2003)

Multiple-time-instant 2D thermal mapping during a single ESD event. - Viktor Dubec; Sergey Bychikhin; M. Blaho; Michael Heer; Dionyz Pogany; Marie Denison; Nils Jensen; Matthias Stecher; Gerhard Groos; Erich Gornik (Microelectron. Reliab., 2004)

Automated setup for thermal imaging and electrical degradation study of power DMOS devices. - Michael Heer; Viktor Dubec; M. Blaho; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Marie Denison; Matthias Stecher; Gerhard Groos (Microelectron. Reliab., 2005)