Ageing of SiC JFET transistors under repetitive current limitation conditions. - M. Bouarroudj-Berkani; D. Othman; Stéphane Lefebvre; S. Moumen; Zoubir Khatir; T. Ben Sallah (Microelectron. Reliab., 2010)

Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition. - Amrane Oukaour; Boubekeur Tala-Ighil; Bertrand Pouderoux; M. Tounsi; M. Bouarroudj-Berkani; Stéphane Lefebvre; Bertrand Boudart (Microelectron. Reliab., 2011)

Comparison study on performances and robustness between SiC MOSFET & JFET devices - Abilities for aeronautics application. - D. Othman; M. Bouarroudj-Berkani; Stéphane Lefebvre; Ali Ibrahim; Zoubir Khatir; A. Bouzourene (Microelectron. Reliab., 2012)