State-Independent Low Resistance Drift SiSbTe Phase Change Memory for Analog In-Memory Computing Applications. - Huai-Yu Cheng; Zhi-Lun Liu; A. Majumdar; Alexander Grun; A. Ray; J. Su; Malte J. Rasch; Fabio Carta; Lynne M. Gignac; Christian Lavoie; C. W. Cheng; M. Bright Sky; et al. (VLSI Technology and Circuits, 2024)

Enhancing 3D XPT/SOM Reliability: Strategies for Mitigating Spike Current and Improving Read Endurance. - C. L. Sung; D. Daudelin; Wei-Chih Chien; R. C. Jordan; S. Cheng; Lynne M. Gignac; Douglas M. Bishop; C. W. Yeh; L. Buzi; C. W. Cheng; J. X. Zheng; E. K. Lai; et al. (IMW, 2025)