Reliability considerations in pulsed power resonant conversion. - Fabio Carastro; Alberto Castellazzi; Jon C. Clare; M. C. Johnson; Michael J. Bland; Patrick W. Wheeler (Microelectron. Reliab., 2009)

Design and test of a high power IGBT non-destructive tester. - Ashraf Ahmed; Alberto Castellazzi; L. Coulbeck; M. C. Johnson (ISIE, 2012)

Circuit design and experimental test of a high power IGBT non-destructive tester. - Ashraf Ahmed; Alberto Castellazzi; L. Coulbeck; M. C. Johnson (Microelectron. Reliab., 2012)