Detectability of automotive power MOSFET on-resistance failure at high current induced by Wafer Fab process excursion. - Yann Weber; Julien Goxe; M. Castignolles (Microelectron. Reliab., 2013)

Failure analysis on recovering low resistive via in mixed-mode device. - M. Castignolles; Julien Goxe; R. Martin (Microelectron. Reliab., 2015)