Read disturb on flash memories: Study on temperature annealing effect. - Luca Cola; M. De Tomasi; Riccardo Enrici Vaion; A. Mervic; P. Zabberoni (Microelectron. Reliab., 2012)

Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities. - Riccardo Enrici Vaion; Matteo Medda; Alberto Mancaleoni; Giovanna Mura; A. Pintus; M. De Tomasi (Microelectron. Reliab., 2017)

Improving Ge-rich GST ePCM reliability through BEOL engineering. - Andrea Redaelli; Anna Gandolfo; Giulia Samanni; Enrico Gomiero; Elisa Petroni; Luca Scotti; Andrea Lippiello; Paolo Mattavelli; J. Jasse; D. Codegoni; A. Serafini; Rossella Ranica; et al. (ESSDERC, 2021)