The right way to assess electronic system reliability: FIDES. - P. Charpenel; F. Davenel; R. Digout; M. Giraudeau; M. Glade; J. P. Guerveno; N. Guillet; A. Lauriac; S. Male; D. Manteigas (Microelectron. Reliab., 2003)

Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics. - E. Scanff; K. L. Feldman; S. Ghelam; Peter Sandborn; M. Glade; B. Foucher (Microelectron. Reliab., 2007)