High Voltage Tolerant Design with Advanced Process for TV Application. - S. E. Liu; M. H. Hsieh; Y. R. Chen; J. Y. Jao; M. Z. Lin; Y. H. Fang; M. J. Lin (IRPS, 2019)

Comprehensive Quality and Reliability Management for Automotive Product. - M. H. Hsieh; W. S. Chiang; Harry H. Chen; M. Z. Lin; M. J. Lin (IRPS, 2020)

Self-healing LDMOSFET for high-voltage application on high-k/metal gate CMOS process. - Jing-Chyi Liao; Paul Ko; M. H. Hsieh; Zheng Zeng (IRPS, 2020)

Enhancing EM Reliability and Lifetime Modeling: A Multi-Link Structure Approach. - H. C. Chang; P. J. Liao; S. H. Chen; Y. K. Chang; C. P. Li; W. C. Liao; M. H. Hsieh; H. W. Yang; J. H. Lee; C. M. Huang; Jun He (IRPS, 2024)