Degradation mechanisms of AlGaN/GaN HEMTs under 800 MeV Bi ions irradiation. - Zhifeng Lei; H. X. Guo; M. H. Tang; C. Zeng; Zhangang Zhang; H. Chen; Yunfei En; Y. Huang; Yiqiang Chen 002; Chao Peng (Microelectron. Reliab., 2018)