Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. - M. Iqbal Mahmud; Amit Gupta; Maria Toledano-Luque; N. Rao Mavilla; Jeffrey B. Johnson; P. Srinivasan 002; A. Zainuddin; S. Rao; Salvatore Cimino; Byoung Min; Tanya Nigam (IRPS, 2019)