Test point insertion for compact test sets. - M. J. Geuzebroek; J. Th. van der Linden; Ad J. van de Goor (ITC, 2000)

Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume. - M. J. Geuzebroek; J. Th. van der Linden; Ad J. van de Goor (ITC, 2002)

TPI for improving PR fault coverage of Boolean and three-state circuits. - M. J. Geuzebroek; Ad J. van de Goor (ETW, 2003)