Fast chip aging prediction by product-like VMIN drift characterization on test structures. - S. E. Liu; G. Y. Chen; M. K. Chen; David Yen; W. A. Kuo; C. S. Fu; Y. S. Tsai; M. Z. Lin; Y. H. Fang; M. J. Lin (IRPS, 2018)

High Voltage Tolerant Design with Advanced Process for TV Application. - S. E. Liu; M. H. Hsieh; Y. R. Chen; J. Y. Jao; M. Z. Lin; Y. H. Fang; M. J. Lin (IRPS, 2019)

Comprehensive Quality and Reliability Management for Automotive Product. - M. H. Hsieh; W. S. Chiang; Harry H. Chen; M. Z. Lin; M. J. Lin (IRPS, 2020)