DC and RF analysis of ScAlN/GaN/β-Ga2O3 and ScAlN/InGaN/GaN/β-Ga2O3 HEMTs on SiC substrate. - M. Jagadesh; A Karthikeyan; Devaraj Somasundaram (Microelectron. J., 2024)

Data mining techniques for LULC analysis using sparse labels and multisource data integration for the hilly terrain of Nilgiris district, Tamil Nadu, India. - Ramalingam Kumaraperumal; Moorthi Nivas Raj; Sellaperumal Pazhanivelan; M. Jagadesh; Duraisamy Selvi; Dhanaraju Muthumanickam; Ramasamy Jagadeeswaran; A. Karthikkumar; S. Kamalesh Kanna (Earth Sci. Informatics, 2025)