Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology. - M. Jamil; S. Mukhopadhay; M. Ghoneim; A. Shailos; Chetan Prasad; Inanc Meric; Stephen Ramey (IRPS, 2023)

A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes. - S. Mukhopadhyay; C. Chen; M. Jamil; Jihan Standfest; Inanc Meric; Balkaran Gill; Stephen Ramey (IRPS, 2023)

An Intel 3 Advanced FinFET Platform Technology for High Performance Computing and SOC Product Applications. - Walid M. Hafez; D. Abanulo; M. Abdelkader; S. An; C. Auth; D. Bahr; V. Balakrishnan; Rohan Bambery; M. Beck; M. Bhargava; S. Bhowmick; J. Biggs-houck; et al. (VLSI Technology and Circuits, 2024)