Parameterized Modeling of Open-Circuit Critical Volume for Three-Dimensional Defects in VLSI Processing. - M. K. Kidambi; Akhilesh Tyagi; Mohammed R. Madani; Magdy A. Bayoumi (VLSI Design, 1994)

Three-dimensional defect sensitivity modeling for open circuits in ULSI structures. - M. K. Kidambi; Akhilesh Tyagi; Mohammed R. Madani; Magdy A. Bayoumi (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998)