Impact of interface and bulk trapped charges on transistor reliability. - G. Ghidini; M. Langenbuch; R. Bottini; D. Brazzelli; Andrea Ghetti; N. Galbiati; G. Giusto; A. Garavaglia (Microelectron. Reliab., 2005)

In situ steam generation (ISSG) versus standard steam technology: impact on oxide reliability. - M. Langenbuch; R. Bottini; Maria Elena Vitali; G. Ghidini (Microelectron. Reliab., 2005)