C. M. Jiang
According to our database1,
C. M. Jiang
authored at least 2 papers
in 2018.
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Bibliography
2018
Correlation between SET-state current level and read-disturb failure time in a resistive switching memory.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Investigation of data pattern effects on nitride charge lateral migration in a charge trap flash memory by using a random telegraph signal method.
Proceedings of the IEEE International Reliability Physics Symposium, 2018