Opens localization on silicon level in a Chip Scale Package using space domain reflectometry. - Jan Gaudestad; Vladimir Talanov; M. Marchetti (Microelectron. Reliab., 2013)

Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package. - Antoine Reverdy; M. Marchetti; Allesandra Fudoli; Alberto Pagani; V. Goubier; M. Cason; Jesse Alton; Martin Igarashi; G. Gibbons (Microelectron. Reliab., 2014)

Classification grid and evidence matrix for evaluating digital medical devices under the European union landscape. - Magali Boers; Aude Rochereau; Louisa Stuwe; Lorena San Miguel; Jochen Klucken; Fruzsina Mezei; Jérôme Fabiano; Sandrine Boulet; Aymeric Perchant; Rosanna Tarricone; Francesco Petracca; Barbara Hoefgen; et al. (npj Digit. Medicine, 2025)