A reliable guideline to maximize the detection and analysis of deep level defects: Comparison between DLTS analysis techniques. - Mounir Hanine; M. Masmoudi (Microelectron. J., 2006)

Conductive behavior modeling of dual-axis CMOS MEMS convective accelerometers using 3D FEM and spherical model. - Brahim Mezghani; Fares Tounsi; H. Yaich; M. Masmoudi (SSD, 2013)

Low noise high frequency CNTFET amplifier. - Wafa Makni; I. Barrage; Hekmet Samet; M. Masmoudi; Montasar Najari (DTIS, 2013)

Characterization of HTRB stress effects on SiC MOSFETs using photon emission spectral signatures. - N. Moultif; Eric Joubert; M. Masmoudi; Olivier Latry (Microelectron. Reliab., 2017)