On Line Surface Roughness Measurement Using Image Processing and Machine Vision. - M. Rajaram Narayanan; S. Gowri; M. Murali Krishna (World Congress on Engineering, 2007)

A new approach to minimize leakage power in nano-scale VLSI adder. - Pradeep Jamwal; M. B. Srinivas; G. V. K. Sarma; M. Murali Krishna (ICWET, 2010)

Design of high-speed low-power differential dynamic-like static CMOS circuit families. - Goli Sri Venkata Prabhuji; M. Murali Krishna (Int. J. Inf. Commun. Technol., 2011)