Scanning electron beam induced deposition for conductive tip modification. - P. L. Chen; James Su; M. H. Shiao; M. N. Chang; C. H. Lee; Chee Wee Liu (NEMS, 2012)

An investigation of capacitance aging model for extreme low-k and high-k dielectrics. - M. N. Chang; Y.-H. Lee; S. Y. Lee; C. C. Chiu; D. Maji; K. Wu (IRPS, 2015)

A Novel Constant E-Field Methodology for Intrinsic TDDB Lifetime Projection. - A. S. Teng; C. W. Lin; M. N. Chang; Aaron Wang; Ryan Lu (IRPS, 2019)