Reliability of polycrystalline silicon thin film resistors. - M. Nakabayashi; Hidenori Ohyama; Eddy Simoen; M. Ikegami; Cor Claeys; K. Kobayashi; M. Yoneoka; K. Miyahara (Microelectron. Reliab., 2001)

Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation. - Hidenori Ohyama; M. Nakabayashi; Eddy Simoen; Cor Claeys; T. Tanaka; T. Hirao; S. Onada; K. Kobayashi (Microelectron. Reliab., 2001)

Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle. - Hidenori Ohyama; Eddy Simoen; S. Kuroda; Cor Claeys; Y. Takami; T. Hakata; K. Kobayashi; M. Nakabayashi; Hiromi Sunaga (Microelectron. Reliab., 2001)

Single-chip FEC codec using a concatenated BCH code for 10 Gb/s long-haul optical transmission systems. - Katsutoshi Seki; K. Mikami; A. Katayama; S. Suzuki; N. Shinohara; M. Nakabayashi (CICC, 2003)