Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. - Georg Haberfehlner; Sergey Bychikhin; Viktor Dubec; Michael Heer; A. Podgaynaya; M. Pfost; Matthias Stecher; Erich Gornik; Dionyz Pogany (Microelectron. Reliab., 2009)

Machine Learning-based Condition Monitoring from Power Cycling Data for Silicon Carbide Power Inverter Modules. - J. Olschewski; M. Hoppe; E. Kusmenko; K. Knobloch; A. Martin; Marc Tüllmann; M. Pfost (IRPS, 2025)